Facilities - Strumenti

Spectrophotometer:

Perkin-Elmer lambda 45 (190-900 nm)
Perkin-Elmer lambda 9 (190-1000 nm)

Spectrofluorimeter:

Edinburgh FLS920 (200-1700nm)
Spex Fluorolog II 1681 (200-900 nm)
Perkin Elmer LS-50B (200-900)

Spectropolarimeter JASCO J-715

Time Correlated Single-Photon Counting apparatus with nanosecond resolution:

IBH 5000U Single-Photon Counting Spectrometer
Nanosecond Resolution;
Edinburgh FLS920 (sources: Laser Diodes,
detection range: 400-1700 nm)

Laser flash-photolysis systems with nanosecond resolution based on:

Nd-YAG laser (detection range: 250-800 nm);
N₂ laser (detection range: 250-800 nm);
Excimer Laser (Xe Cl) (detection range: 250-800 nm);
Nd-YAG pumped OPO (detectiion range: 250-1700 nm).

Pump and probe system for time resolved Absorption Determination with Picosecond Resolution (Nd-YAG pump)

Streak Camera with 2ps resolution

Time resolved spectrofluorimeter with picosecond resolution (Nd-YAG pump)
Vacuum System (10^-7 Torr)
Variable temperature cell holder (liquid nitrogen)

Cleanroom with:

High vacuum thin film coating system with multiple heating source for layer by layer deposition (Edwards Auto306);
Sputtering equipment for metal and metal-oxide deposition (Edwards Auto306);
Spin-coating set up (Headway Res. Inc);
Variable speed pneumatic lift (ISTA) for dip-coating.

High resolution surface profiler Alpha-Step 200 (Tencor Inst.)

High resolution surface profiler Alpha Step IQ (Tencor Inst.)

Time-of-flight (TOF) measurements apparatus with a pulsed N₂ laser (8 ns pulse width and average maximum energy of 3 mJ/pulse)

Photoconductivity measurements set up with 200-1000nm excitation wavelength range and detector with 10^-12 Ampere sensitivity

Surface charge analyzer

Glove box equipped with:

high vacuum coating and spin coating to fabricate organic devices
electroluminescence characterization system to test the devices

Scanning Probe Microscope CP Research (Veeco Inst.): AFM (C, NC and Tapping modes), STM and Kelvin Probe microscopy

Updated (06/02/2009)